Instrument
Flatness/Parallelism of Measurement Area
Typical parallelism < 1μm
Hanatek Variable Force Precision Thickness Gauge (FT3-V)
- Variable force thickness measurement by manual addition of weight
- Example configurations include ISO 534 / TAPPI T411 (paper and board ), ASTM D6988 (film, standard & low pressure)
- 0.1µm resolution, 0.4µm accuracy
- User programmable dwell time and measuring speed
Why is thickness measured?
Accurate and repeatable thickness measurements can improve product quality whilst controlling the costs associated with raw material usage.
The thickness of a material can directly impact the value of many other parameters including:
- Strength
- Stiffness
- Puncture resistance
- WVTR
- CO2
- O2
- Haze
- Opacity
- Direct Costs
- Raw materials, especially speciality polymers
- Indirect Costs
- Rework/Recycling/Replacement cost – Spoiled package content
Why is film thickness important?
Plastic films are often used to encapsulate, protect and preserve products that are sold to consumers or industry. The film is used as a two way barrier to stop product leaking out and also external contaminants migrating in.
How is thickness measured?
Physical test parameters can be factory configured according to international standards or customer requirements. The accuracy of thickness measurement is determined by several key operating factors.
Parameters affecting the accuracy of thickness measurement
Momentum and Profile of Measurement Probe
Measurement probes are factory configured according to the test standard required.
Measurement Pressure
Additional weights are added to vary the pressure according to requirements from standards.
Measurement Dwell Time
Dwell time can be varied according to application requirements
Typical parallelism < 1μm
Comparison of thickness measurement techniques
The accuracy of thickness measurement is determined by several key operating factors.
| Handheld Micrometer | Bench/Sprung Micrometer | Precision Thickness Gauge | |
|---|---|---|---|
| Measurement pressure | Variable by operator | Not always to standard | Fixed to standard or variable |
| Measurement foot | Not always to standard | Not always to standard | Fixed to relevant standard |
| Dwell time | Not controlled | Not controlled | Selected by operator |
| Measurement speed | Not controlled | Not controlled | Selected by operator |
| Programmable measurements | None | None | User select up to 500 readings |
| Statistical analysis | None | Manual/automatic | Automatic with time/date stamped printout |
| Sensor resolution | 1 μm | 1 μm | 0.1 / 0.01 μm |
| Repeatability | 2 - 10 μm | 2 - 10 μm | 0.4 μm (or better dependant on operating conditions) |
| Reproducibility | 2 - 20 μm | 2 - 10 μm | 0.8 μm (or better dependant on operating conditions) |
Applications
The Hanatek Precision Thickness Gauge (FT3) is specifically designed to quickly and accurately measure the thickness of a variety of substrates including film, paper, board, foil, tissue and textiles.
Carton board
Carton board thicknessISO 3034
Paper
Thickness of paper and boardISO 534, TAPPI T411
Plastic film
Thickness of plastic filmASTM6988; ISO 4593 / BS2782
Adhesive tape
Thickness of pressure sensitive tapesASTM 3652
Flexible packaging
Flexible packaging thicknessASTM F2251
Textiles
Thickness of textile, leatherASTM D1777, ISO 2589, ISO 5084
Flooring
Floor coverings thickness Solid throughoutEN428
Geomembrane
Geosynthetics thicknessASTM D5199
Tissue paper
Tissue thicknessISO 12625
Nonwoven
Nonwoven thicknessISO 9073-2/EDANA
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Other Applications
Rhopoint can configure thickness gauges to suit applications that do not have a recommended international standard.
Test types
Standard Test
Full statistical analysis of up to 500 readings. Maximum, minimum, mean and standard deviation.
This option is for measuring sample sets using pre-defined up and down times as well as the speed of the measurement head.
Batch Test
This option puts the instrument into comparative test mode. This test is used to measure the relative thickness of two materials. Two batches of readings are taken; the average thickness difference between the two values is displayed. Calculates the thickness difference between two measurement sets, used to assess the thickness of coating, adhesives or sample batches.
Standard Tare Test
Automatically tares the instrument before each test using user defined conditions. When this option is selected, the instrument is automatically TARED before each sample set is measured. This option virtually eliminates thermo-electronic drift and thermo-mechanical errors from measurement.
Pass/Fail Test
Enter the target material thickness and the allowed percentage tolerance. If the target thickness is not known, the material can be measured and assigned as the ‘master’. Subsequent measurements this can be made against this reference material.
Sheet Count Test
This test mode will count sheets or layers of sample as well as showing the total thickness of a stack of samples. A master count of user selectable size is measured as a reference. This value is stored and subsequent measurements will be compared to this master reading. A pass/fail option is available to reject any reading out of the desired tolerance.
Benefits of using the Hanatek FT3
- Repeatability of better than 0.4 μm
- 0.01 μm resolution on the FT3-U version
- Measure in micron, millimeter or thou
- User programmable number of readings, dwell time and down speed
- Constant contact pressure, configured to ISO and ASTM standards
Defined Parameters
Up Time: This parameter allows the user to manipulate samples between measurements (1-10s).
Speed Measurement: The speed of the measurement head is especially important when measuring deformable materials (1-5mm/s).
Dwell/Down Time: The dwell time determines the setting time of the measuring head on compressible materials (1-1s).
Results
This flexible instrument can be configured for quality or research use. All operations and test methods have comprehensive graphical on-screen help.
Print All Samples
This option allows all measured values in a test to be output to the Hanatek printer/ RS232 port.
QA Labels Record Results Throughout the Batch
Securely time and date stamped labels with statistical results can be produced throughout a batch run and attached to job card or retained samples.
This traceable control gives the customer confidence that the whole batch of product is within specification and allows manufacturers to issue certificates
of conformance.
Available configurations
Each standard of compliance specifies a different pressure which is calculated by the force applied to the sample through a measuring head of a given diameter.
FT3: Standard Instrument
Fixed pressure, factory configured to meet a single test standard or specification of your choice.
- Repeatability of better than 0.4 μm
- 0.1 μm resolution
- User programmable number of readings, dwell time and down speed
Thickness of plastic film ASTM 6988; ISO 4593/BS2782
FT3-V: Variable Instrument*
Test pressure is varied by adding external weights to the instrument platform. Factory configured measurement head size. One external weight is included to achieve compliance to a second measurement standard or assess material compressibility.
- Additional external weights can be applied to increase measurement pressure up to 4kg total
- Variable force by manual addition of weight
Thickness of paper and card board ISO 534 & TAPPI T411